Title of article :
Goodness-of-fit tests for parametric regression with selection biased data
Author/Authors :
Ojeda Cabrera، نويسنده , , Jorge L. and Van Keilegom، نويسنده , , Ingrid، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2009
Pages :
15
From page :
2836
To page :
2850
Abstract :
Consider the nonparametric location-scale regression model Y = m ( X ) + σ ( X ) ε , where the error ε is independent of the covariate X , and m and σ are smooth but unknown functions. The pair ( X , Y ) is allowed to be subject to selection bias. We construct tests for the hypothesis that m ( · ) belongs to some parametric family of regression functions. The proposed tests compare the nonparametric maximum likelihood estimator (NPMLE) based on the residuals obtained under the assumed parametric model, with the NPMLE based on the residuals obtained without using the parametric model assumption. The asymptotic distribution of the test statistics is obtained. A bootstrap procedure is proposed to approximate the critical values of the tests. Finally, the finite sample performance of the proposed tests is studied in a simulation study, and the developed tests are applied on environmental data.
Keywords :
Bootstrap , Empirical process , Goodness-of-fit test , heteroscedastic model , Location-scale regression , Model diagnostics , Nonparametric regression , weak convergence , Biased sampling
Journal title :
Journal of Statistical Planning and Inference
Serial Year :
2009
Journal title :
Journal of Statistical Planning and Inference
Record number :
2220164
Link To Document :
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