Monitoring and diagnosing dependent process steps using VSI control charts

The paper proposes the variables sampling interval (VSI) scheme to monitor the means and the variances in two dependent process steps. The performance of the considered VSI control charts is measured by the adjusted average time to signal derived by a Markov chain approach. An example of the process control for the metallic film thickness of the computer connectors system shows the application and performance of the proposed VSI control charts in detecting shifts. Furthermore, the performance of the VSI control charts and the fixed sampling interval control charts are compared via the numerical analysis results. These demonstrate that the former is much faster in detecting shifts. Whenever quality engineers cannot specify the values of variable sampling intervals, the optimal VSI control charts are recommended. Furthermore, the impacts of misusing Shewhart charts to monitoring the process mean and variance in the second process step are also investigated.