On D-optimal robust designs for lifetime improvement experiments

Locating the optimal operating conditions of the process parameters is critical in a lifetime improvement experiment. For log-normal lifetime distribution with compound error structure (i.e., symmetry, inter-class and intra-class correlation error structures), we have developed methods for construction of D-optimal robust first order designs. It is shown that D-optimal robust first order designs are always robust first order rotatable but the converse is not always true.