Two-level minimum aberration designs in N =2 (mod 4) runs

For two-level factorials, we consider designs in N=2 (mod 4) runs as obtained by adding two runs, with a certain coincidence pattern, to an orthogonal array of strength two. These designs are known to be optimal main effect plans in a very broad sense in the absence of interactions. Among them, we explore the ones having minimum aberration, with a view to ensuring maximum model robustness even when interactions are possibly present. This is done by sequentially minimizing a measure of the bias caused by interactions of successively higher orders.