Title of article :
Economic Reliability Test Plans using the Generalized Exponential Distribution
Author/Authors :
ASLAM، M. نويسنده , , Qaisar Shahbaz2، Muhammad نويسنده ,
Issue Information :
سالنامه با شماره پیاپی سال 2007
Pages :
8
From page :
53
To page :
60
Abstract :
Economic Reliability Test Plans (ERTP) are developed assuming that the life time follows the Generalized Exponential Distribution (GED). For a given termination number, sample size and producer’s risk waiting time to terminate the experiment are computed. Comparisons of these reliability plans have been made with reliability plans of the Log-Logistic Distribution (Kantam et al., 2006). On the basis of the Kolmogorov-Smirnov test for both distributions it is found that the reliability plans obtained from GED are more economic in saving cost, energy and time. The results are explained with the help of tables and examples.
Keywords :
Life Tests , Generalized exponential distribution , Reliability Test Plans , Log-logistic distributions
Journal title :
Journal of Statistics
Serial Year :
2007
Journal title :
Journal of Statistics
Record number :
225634
Link To Document :
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