Title of article :
Pb diffusion in zircon
Author/Authors :
Cherniak، نويسنده , , D.J and Watson، نويسنده , , E.B، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
20
From page :
5
To page :
24
Abstract :
Diffusion of Pb was characterized in natural and synthetic zircon under a range of conditions. In most experiments, mixtures of Pb sulfate and ground zircon were used as the sources of diffusant, with Pb depth profiles measured with Rutherford Backscattering Spectrometry (RBS). As complement to these “in-diffusion” experiments, “out-diffusion” experiments were run on both synthetic Pb-doped and natural zircon with relatively high Pb concentrations, and analyzed with either electron microprobe or RBS. he temperature range 1000–1500°C, the following Arrhenius relation was obtained:D=1.1×10−1exp(−550±30 kJ mol−1/RT) m2 s−1Results for diffusion in natural and synthetic zircon were quite similar, as are those for in- and out-diffusion. Pb diffusion does not appear to be strongly influenced by pressure, crystallographic orientation, or the presence of water. ow diffusion rate for Pb indicates that Pb isotope ratios will not be altered by volume diffusion in crystalline zircon under most geologic conditions, a finding consistent with the frequent observation of inheritance and preservation of multistage histories in zircon. Most Pb loss in zircon, then, is likely a consequence of recrystallization or Pb transport in zircons with severe radiation damage (although the latter can be effective only for vast annealing times at very low temperatures). losure temperatures, calculated from the diffusion parameters, are in excess of 900°C for zircons of typical size, a result in consonance with field-based estimates of closure temperatures.
Keywords :
Arrhenius relation , Rutherford backscattering spectrometry , Pb Zircon diffusion
Journal title :
Chemical Geology
Serial Year :
2001
Journal title :
Chemical Geology
Record number :
2256766
Link To Document :
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