SiC-Al interface crystallographic orientation relationship in a squeeze-cast SiCw/Al composite

A SiC-Al interface in a squeeze-cast SiCw/6061 Al composite was studied by means of scanning transmission electron microscopy and high-resolution electron microscopy. A crystallographic orientation relationship was found at the SiC-Al interface and was identified as (011̄)sic//(001)Al, [211]sic//[100]Al. Based on crystallography theory, the formation mechanism of the orientation relationship was analyzed in detail. A semicoherent atom matching model of the SiC-Al interface was developed that can explain why the squeeze-cast SiCw/6061 Al composite has a high interface bond strength.