Characterization of mullite/ZrO2 toughness ceramic materials microstructure by medium voltage analytical electron microscopy

A series of mullite/ZrO2 and mullite/alumina/ZrO2 high-toughness ceramic materials have been examined by analytical electron microscopy (AEM) at 300 kV and by using the following techniques: energy dispersive X-ray (EDX) microanalysis, microdiffraction and convergent beam electron diffraction (CBED). The relative advantages and disadvantages for the analysis at higher voltages on the investigation of advanced ceramics are compared with results obtained at 120 kV.