The effect of substrate temperature on the structure of tin oxide thin films obtained by spray pyrolysis method

Undoped SnO2 thin films were prepared on glass substrates by spray pyrolysis technique. The variation in the structural properties with a variation in the substrate temperature was investigated by means of X-ray diffraction (XRD). In this paper we employed the XRD technique to achieve the impression of the crystalline planes and also the possible orientation of crystallites in the films prepared at different substrate temperature ranging from 250 to 575 °C.