Stereological characterization of the γʹ particles in a nickel base superalloy: Comparison between transmission electron microscopy and atomic force microscopy techniques

Critical comparison of transmission electron microscopy and atomic force microscopy techniques was provided concerning size measurements of γʹ precipitates in a nickel-base superalloy. The divergence between results is explained in terms of the resolution limit for atomic force microscopy, linked both to the tip dimension and the diameter of the investigated particles.