Title of article :
Photothermal Investigation of Ti-Cu-N and Ti-Ni-N PVD Films
Author/Authors :
G. and Prekel، نويسنده , , H. and Klopfstein، نويسنده , , M.J. and Giesselbach، نويسنده , , M. and Patzelt، نويسنده , , S. and Ghisleni، نويسنده , , R. and Lucca، نويسنده , , D.A. and Goch، نويسنده , , G. and Stock، نويسنده , , H.-R.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
4
From page :
585
To page :
588
Abstract :
Thin titanium based PVD films on steel substrates are promising material combinations for high quality moulding tools required for the manufacturing of complex optical components. The chemical film composition and PVD process parameters determine the thermal and mechanical layer properties, which must remain stable at high temperatures during the moulding process. This paper describes the investigation of thermal and mechanical film properties with respect to film composition and thermal treatment at temperatures typical for moulding processes.
Keywords :
Physical vapour deposition (PVD) , Coating , photothermal radiometry
Journal title :
CIRP Annals - Manufacturing Technology
Serial Year :
2006
Journal title :
CIRP Annals - Manufacturing Technology
Record number :
2267599
Link To Document :
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