• Title of article

    SiC-based cermet with electrically conductive grain boundaries

  • Author/Authors

    Balog، نويسنده , , M. and Kovac، نويسنده , , J. and ?atka، نويسنده , , A. and Ha?ko، نويسنده , , D. and Zhang، نويسنده , , J. and Crimp، نويسنده , , M.A. and V?vra، نويسنده , , O. and V?vra، نويسنده , , I.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2010
  • Pages
    7
  • From page
    420
  • To page
    426
  • Abstract
    The present paper deals with the characterization of structural and electrical properties of SiC-based cermets prepared by in situ reaction. The surface structure and electrical conductivity of the samples was investigated by the standard four-point probe method, SEM, TEM, AFM, and STM techniques. It was found that the electrical conductivity of the SiC-based ceramic–metal composites increases with increased fraction of metallic phases. Interestingly, samples containing app. 12 vol.% of non-percolated (isolated) metallic phases exhibit up to 2 orders of magnitude better electrical conductivity compared with the base-line liquid phase sintered SiC (LPS SiC). This effect results from doping of the SiC grains by diffusion of metallic components as well as from chemical modification of the grain boundary phases due to the reaction of sintering aids and metallic particles at high sintering temperatures. Absorbed current measurements using SEM, as well as AFM in spreading resistance and STM in tunneling mode were used for visualization of electrical pathways.
  • Keywords
    Cermets , electrical conductivity , diffusion , Grain boundaries , AFM , SEM , TEM , STM
  • Journal title
    Materials Characterization
  • Serial Year
    2010
  • Journal title
    Materials Characterization
  • Record number

    2267740