Title of article
Focused Ion Beam (FIB) tomography of nanoindentation damage in nanoscale metal/ceramic multilayers
Author/Authors
Singh، نويسنده , , D.R.P. and Chawla، نويسنده , , N. and Shen، نويسنده , , Y.-L.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2010
Pages
8
From page
481
To page
488
Keywords
3D materials science , Serial sectioning , Focused ion beam (FIB) , Nanoindentation
Journal title
Materials Characterization
Serial Year
2010
Journal title
Materials Characterization
Record number
2267758
Link To Document