Title of article :
Understanding behavior of machining interface and dielectric molecular medium in nanoscale electro-machining
Author/Authors :
Kalyanasundaram، نويسنده , , V. and Virwani، نويسنده , , K.R. and Spearot، نويسنده , , D.E. and Malshe، نويسنده , , A.P. and Rajurkar، نويسنده , , K.P.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Pages :
4
From page :
199
To page :
202
Abstract :
Recently, a repeatable and scalable nanoscale electro-machining (nano-EM) process to produce sub-20 nm scale features has been demonstrated. In the presented research, the behavior of the liquid dielectric (n-decane) machining medium in nano-confinement (<3 nm) under physical boundary conditions is investigated using molecular dynamics (MD) simulation. Results show a four-fold increase in the density of n-decane indicating ‘quasi-solid’ behavior at the nano-EM interface, thereby acting as an effective charge transport medium between the nano-tool and the workpiece. The effect of such quasi-solid medium is demonstrated through the experimental observations of electrical breakdown (BD) at the sub-20 nm scale interface.
Keywords :
Nanoscale electrical breakdown , SIMULATION , Electrical discharge machining
Journal title :
CIRP Annals - Manufacturing Technology
Serial Year :
2008
Journal title :
CIRP Annals - Manufacturing Technology
Record number :
2268028
Link To Document :
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