Title of article :
Depth-sensing indentation of nanomaterials and nanostructures
Author/Authors :
Palacio، نويسنده , , Manuel L.B. and Bhushan، نويسنده , , Bharat، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2013
Pages :
20
From page :
1
To page :
20
Abstract :
Due to its capacity for applying ultralow loads and detecting nanometer-scale deflections, nanoindentation has been used to investigate the mechanical behavior of various material configurations at the micro- and nano-scales. The emphasis of the article is on the nanoscale deformation of nanoparticles, micro/nanopillars, microbeams, micro/nanofibers, nanocomposites, membranes and monolayer films, which are all ubiquitous structures in nanotechnology. The small volumes of these structures have led to the elucidation of material deformation mechanisms that are not the same as their bulk counterparts. Advances in instrumentation have enabled nanoindentation experiments to be conducted in situ in conjunction with scanning electron microscopy (SEM), electron backscatter diffraction (EBSD), transmission electron microscopy (TEM), electrical contact resistance (ECR) measurements, atomic force microscopy (AFM), among others, and examples of these studies will be discussed.
Keywords :
Indentation , Nanoindentation , NANOTECHNOLOGY , Nanoparticles , Nanostructures
Journal title :
Materials Characterization
Serial Year :
2013
Journal title :
Materials Characterization
Record number :
2268733
Link To Document :
بازگشت