Title of article :
Local Electrode Atom Probes
Author/Authors :
Kelly، نويسنده , , Thomas F and Larson، نويسنده , , David J، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Abstract :
The historical developments leading to the advent of Local Electrode Atom Probes (LEAP) are reviewed. An assessment of the state of the art is made, and the major advantages of LEAPs over conventional atom probes are described. The best implementations of these concepts and the remaining challenges for realization of LEAPʹs potential are also described. It is concluded that LEAPs should be an important tool for materials characterization at the atomic scale. Modern materials-dependent industries as diverse as steel and microelectronics should benefit from this technology.
Journal title :
Materials Characterization
Journal title :
Materials Characterization