Title of article :
Atom Probe Field-Ion Microscopy Characterization of Nickel and Titanium Aluminides
Author/Authors :
Larson، نويسنده , , D.J. and Miller، نويسنده , , M.K، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
18
From page :
159
To page :
176
Abstract :
A review of the contributions of atom probe field-ion microscopy to the characterization of nickel and titanium aluminides is presented. The nickel aluminide systems studied include boron-doped Ni3Al and boron-, carbon-, beryllium-, zirconium-, molybdenum-, and hafnium-doped NiAl. These systems have been characterized in terms of solute segregation to boundaries, dislocations, and other defects, matrix solubilities, precipitation, and site-occupation probabilities. The partitioning behavior of impurities and alloying additions, matrix solubilities, precipitate compositions, and interfacial segregation in several of α2 + γ titanium aluminides and related alloys are also reviewed. Published by Elsevier Science Inc.
Journal title :
Materials Characterization
Serial Year :
2000
Journal title :
Materials Characterization
Record number :
2270421
Link To Document :
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