Title of article
Laser diode reliability: crystal defects and degradation modes
Author/Authors
Jiménez، نويسنده , , Juan، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
11
From page
663
To page
673
Abstract
Degradation analysis is a crucial issue for the improvement of high power laser diodes. Degradation occurs in three different modes: rapid, gradual and catastrophic. It can be located inside the cavity or at the facet mirrors. Each type of degradation presents its own signature and different crystal defects appear associated with them. The main physical mechanisms responsible for laser degradation are analysed showing the relation between the main degradation modes and the different materials properties of the laser structures. To cite this article: J. Jiménez, C. R. Physique 4 (2003).
Keywords
Degradation , Dislocation climb , Dislocation glide , Recombinaison , dégradation , Catastrophic degradation , Dark line defects , Dark spot defects , Recombination enhanced defect reaction , Dégradation catastrophique , Défauts lignes noires , Défauts points noirs , Montée de dislocations , Glissement de dislocations
Journal title
Comptes Rendus Physique
Serial Year
2003
Journal title
Comptes Rendus Physique
Record number
2283252
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