• Title of article

    Laser diode reliability: crystal defects and degradation modes

  • Author/Authors

    Jiménez، نويسنده , , Juan، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    11
  • From page
    663
  • To page
    673
  • Abstract
    Degradation analysis is a crucial issue for the improvement of high power laser diodes. Degradation occurs in three different modes: rapid, gradual and catastrophic. It can be located inside the cavity or at the facet mirrors. Each type of degradation presents its own signature and different crystal defects appear associated with them. The main physical mechanisms responsible for laser degradation are analysed showing the relation between the main degradation modes and the different materials properties of the laser structures. To cite this article: J. Jiménez, C. R. Physique 4 (2003).
  • Keywords
    Degradation , Dislocation climb , Dislocation glide , Recombinaison , dégradation , Catastrophic degradation , Dark line defects , Dark spot defects , Recombination enhanced defect reaction , Dégradation catastrophique , Défauts lignes noires , Défauts points noirs , Montée de dislocations , Glissement de dislocations
  • Journal title
    Comptes Rendus Physique
  • Serial Year
    2003
  • Journal title
    Comptes Rendus Physique
  • Record number

    2283252