Title of article :
Optical lithography—present and future challenges
Author/Authors :
Lin، نويسنده , , Burn J.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
17
From page :
858
To page :
874
Abstract :
Optical lithography has been an industrial workhorse for many decades. It has reached a wavelength of 193 nm, a Numerical Aperture (NA) of 0.93 but was facing difficulties to advance further until the debut of immersion lithography. This review deals with the limit of dry and immersion lithography systems, their present and future challenges to reach these very limits. A discussion of defects in immersion lithography, the status of immersion lithography, polarized illumination, high-index materials, solid-immersion mask, double exposure and double patterning is included. To cite this article: B.J. Lin, C. R. Physique 7 (2006).
Keywords :
microlithography , Optical lithography , Immersion lithography , Lithographie optique , Lithographie en immersion , Microlithographie
Journal title :
Comptes Rendus Physique
Serial Year :
2006
Journal title :
Comptes Rendus Physique
Record number :
2283734
Link To Document :
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