Analyses of self-potential anomalies by conventional and extended Euler deconvolution techniques

A unified approach to analyze the self-potential anomalies due to the oxidation–reduction process is developed to compute the location, depth and geometry of the causative source. The method is based on modifications in the conventional and/or the extended Euler homogeneity equations involving first-order horizontal and vertical derivatives. These modifications lead to five independent processes, viz., (a) Scalar SI Computed, (b) Scalar SI Conventional, (c) Scalar Constant, (d) Rotational Conventional and (e) Rotational Constant. SP anomalies are then analyzed for identification of isolated source geometry and determination of the source parameters by these processes. This technique does not require any a priori assumptions about the nature of the nature of the source geometry, the polarization vector, etc. Rather the nature of the source geometry is deciphered/visualized by computing the structural index—a parameter related to source geometry. Source geometries considered are: a point pole, a horizontal line-of-poles, a polarized sphere, horizontal cylinder, and a thin inclined sheet. Three FORTRAN source codes are discussed based on the proposed method. The applicability of this technique has been demonstrated by analyzing three field examples from the published literatures.