Title of article :
Pattern recognition in self-assembly
Author/Authors :
Muthukumar، نويسنده , , Shanmugam Murugappan، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Pages :
7
From page :
48
To page :
54
Abstract :
A common conceptual premise is shared by recognition of chemically patterned surface patches by isolated macromolecules and the self-assembly of diblock copolymer melts and polymer alloys at patterned interfaces. The past year has seen both conceptual and experimental advances in fabricating self-assemblies in a controlled way. These two processes are essential for successful fabrication of materials of order over many length scales.
Keywords :
PBpolybutadiene , SAMself-assembled monolayer , SCFself-consistent field , PSpolystyrene , AFMAtomic force microscopy , PVPpolyvinylpyridine , Lolamellar repeat period , ?CPmicrocontact printing , PMMApolymethylmethacrylate
Journal title :
Current Opinion in Colloid and Interface Science
Serial Year :
1998
Journal title :
Current Opinion in Colloid and Interface Science
Record number :
2304569
Link To Document :
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