• Title of article

    Measuring colloidal forces using evanescent wave scattering

  • Author/Authors

    Bike، نويسنده , , Stacy G، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2000
  • Pages
    7
  • From page
    144
  • To page
    150
  • Abstract
    The evanescent wave scattering technique total internal reflection microscopy has enabled the direct measurement of the mean potential energy of interaction between a Brownian particle and a flat surface. With a distance resolution of 1 nm and a force resolution of 10 fN, this technique has successfully measured a variety of colloidal forces. Recent measurements of van der Waals interactions have given rise to new theories for the effect of surface roughness on the interaction. In addition, recent measurements of depletion interactions have shown that energetic as well as entropic effects must be considered when computing the interaction potential.
  • Keywords
    Total internal reflection microscopy (TIRM) , Evanescent wave light scattering microscopy (EVLSM) , Colloidal forces , Depletion forces , van der Waals forces , Electrostatic forces , radiation pressure
  • Journal title
    Current Opinion in Colloid and Interface Science
  • Serial Year
    2000
  • Journal title
    Current Opinion in Colloid and Interface Science
  • Record number

    2304836