Structural analysis of organic interfacial layers by ellipsometry

Ellipsometry has ‘come of age’ as a technique for the analysis of problems related to colloid and interface science. It has advanced far beyond applications of measuring film thickness or optical constants — although these remain important uses. Studies of the structure of polymers at the solid/liquid interface have been advanced significantly by the realisation of Fourier transform ellipsometry. Another important achievement has been the calibrated measurement of the dynamic surface excess at the flowing surface of a liquid jet. The uses of ellipsometry to study critical adsorption in binary liquids and to measure the width of liquid/liquid interfaces are also noteworthy. An important development is the use of infrared — rather than visible — light, which opens up numerous possibilities for the simultaneous structural and chemical interrogation of interfaces non-invasively.