Diamond anvil cell deformation of CaSiO3 perovskite up to 49 GPa

Radial X-ray diffraction measurements are performed on CaSiO3perovskite between 25.5 and 49.3 GPa at 300 K. The Rietveld method is used to extract quantitative texture and stress information. We find some mismatches in lattice strains evaluated in the Rietveld method with variations of d-spacings for 2 0 0 and 2 1 0 over-estimated while those for 1 1 1 are under-estimated and attribute it to the effect of plastic deformation. The differential stress supported by CaSiO3 perovskite in this study is approximately twice as large as previous measurements and the ratio of differential stress to shear modulus t / G varies between 5.4% and 7.2% between 25 and 49 GPa. The sample displays preferred orientation of the {1 0 0} planes perpendicular to the compression direction, compatible with slip on { 1 1 0 } 〈 1 1 ¯ 0 〉 .