Title of article :
Light scattering near and from interfaces using evanescent wave and ellipsometric light scattering
Author/Authors :
Sigel، نويسنده , , Reinhard، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2009
Pages :
12
From page :
426
To page :
437
Abstract :
The broad range of interface light scattering investigations in recent years shows the power and the versatility of these techniques to address new and open questions in colloid and interface science and the soft condensed matter field. Structural information for polymers, liquid crystals, or colloids close to planar or spherical colloidal interfaces are either captured with long range light scattering resolution, or in a complementary approach by high resolution ellipsometric techniques. Of special interest is the dynamic behavior close to or in interfaces, since it determines material properties and responses to external fields. Due to the broad dynamical range and the high scattering contrast for visible light, interface light scattering is a key to elucidate soft matter interfacial dynamics. This contribution reviews experimental and related theoretical approaches for interface light scattering and further gives an overview of achievements based on such techniques.
Keywords :
dynamic light scattering , Evanescent wave , Mie scatter , Interfacial dynamics , polymer brush , Liquid crystalline anchoring , Surface fluctuations , liquid interface , Wall drag effect on diffusion , Adsorption at an interface , Colloidal interfaces , ellipsometry , Roughness
Journal title :
Current Opinion in Colloid and Interface Science
Serial Year :
2009
Journal title :
Current Opinion in Colloid and Interface Science
Record number :
2305629
Link To Document :
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