Silicon diffusion in silicate minerals

Recently obtained silicon self-diffusion data, DSi = D0exp(− ΔH/RT), in silicates (quartz, itreous silica, forsterite, San Carlos olivine and diopside) show a compensation law that is a linear relation, log D0 =logD* +ΔH/2.303RT*. We find ΔH = 532.6 + 30.4 log D0 (ΔH in kJ/mol and D0 in cm2/s), which corresponds to logD* ⋍ #x02212; 17.5 and T* ⋍ 1588K.D* represents a common value of DSi for all these silicates at T*, but also the value of DSi at ΔH = 0. It has, therefore, a pure entropic signification: D* = fa2νexp(ΔS/R); f is a geometrical factor, a the jump distance and νthe Si-O vibrational stretching optic frequency almost common to all these silicates. Despite the wide range of enthalpies for Si diffusion in silicates, we propose that the compensation law outlines a unique mechanism for Si migration in minerals with structures based on the SiO4 tetrahedron.