Focused ion beam technique and transmission electron microscope studies of microdiamonds from the Saxonian Erzgebirge, Germany

A focused ion beam of Ga ions is a relatively new technique that has been developed for microelectronic industries. Now researchers of the Earth sciences find it to be a promising tool for studying various geological materials. Using the FIB technique and an FEI Strata DB 235 dual beam system, we have successfully prepared several electron-transparent foils, which crossed μm-sized diamonds included in host minerals such as zircon and garnet from quartzofeldspathic rocks of the Saxonian Erzgebirge, Germany. Scanning and transmission electron microscopy applied to these foils revealed that the diamonds contain crystalline nanometric inclusions. These inclusions consist of minerals of known stoichiometries such as SiO2 and Al2SiO5, whereas others are characterized by different combinations of Si, K, P, Ti, and Fe in the presence of oxygen (stoichiometries are not clear at this stage of research). One suite of inclusions is assumed to be represented by archerite, KH2PO4, which is known to be stable at pressures of 4–22 GPa, and one nanocrystal containing Pb, oxygen and carbon is interpreted to be PbxOy or PbCO3. Along with solid crystalline inclusions, the diamonds contain cavities filled by liquid/gas that escaped during sample preparation. These are associated with dislocations of diamond growth. Our data are consistent with the concept of diamond crystallization from a COH-rich multicomponent supercritical fluid and suggest that the composition of such a fluid is more consistent with a local crustal source rather than that of a mantle origin.