Title of article :
Equilibrium depth and spacing of cracks in a tensile residual stressed thin film deposited on a brittle substrate
Author/Authors :
Zhang، نويسنده , , Tong-Yi and Zhao، نويسنده , , Ming-Hao، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Pages :
8
From page :
589
To page :
596
Abstract :
The depth and spacing of cracks in a tensile residual stressed thin film bonded on a brittle substrate are analyzed thermodynamically using the minimum energy theorem on the basis that the film has the same mechanical properties as the substrate. The results show that the cracks penetrate into the substrate. Simple and approximate relationships between three dimensionless parameters, i.e., the normalized crack depth and spacing, and the cracking resistance number, are derived, which determine the fracture behavior of the film.
Keywords :
Crack , Thin films , Critical thickness
Journal title :
ENGINEERING FRACTURE MECHANICS
Serial Year :
2002
Journal title :
ENGINEERING FRACTURE MECHANICS
Record number :
2340070
Link To Document :
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