Simulation of fatigue crack growth in components with random defects

The paper presents a probabilistic method for the simulation of fatigue crack growth from crack-like defects in the combined operating and residual stress fields of an arbitrary component. The component geometry and stress distribution are taken from a standard finite element stress analysis. Number, size and location of crack-like defects are ‘drawn’ from probability distributions. The presented fatigue assessment methodology has been implemented in a newly developed finite-element post-processor, P • FAT, and is useful for the reliability assessment of fatigue critical components. General features of the finite element post-processor have been presented. Important features, such as (i) the determination of the life-controlling defect, (ii) growth of short and long cracks, (iii) fatigue strength and fatigue life distribution and (iv) probability of component fatigue failure, have been treated and discussed. Short and long crack growth measurements have been presented and used for verification of the crack growth model presented.