Title of article :
Nanometer-scale pore fluid distribution and drying damage in preserved clay cores from Belgian clay formations inferred by BIB-cryo-SEM
Author/Authors :
Desbois، نويسنده , , Guillaume and Urai، نويسنده , , Janos L. and Hemes، نويسنده , , Susanne and Brassinnes، نويسنده , , Stephane and De Craen، نويسنده , , Mieke and Sillen، نويسنده , , Xavier، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2014
Pages :
15
From page :
117
To page :
131
Abstract :
This contribution reports on the distribution of in situ pore-water in preserved clay cores from Belgium (Boom Clay at HADES URF level and clay from the Pittem Member of the Gent Formation) and identification of typical pore-scale damage induced by drying. yo-SEM (Broad Ion beam–cryogenic-SEM) shows that the majority of pores visible at the resolution of SEM (> 50 nm) does not contain water, suggesting that the water content measured by weight loss is located in clay aggregates, in pores < 50 nm. e water-free pores are not expecting in situ clay formation, we conclude that the procedure used to preserve the original clay cores is not fully efficient. Observations of evolution of microstructures before and after drying by sublimation of water point to four types of drying-damages driven by the shrinkage of clay particles. On the one hand, quantification of pore size and pore morphologies before and after drying indicates no significant change in statistical pore characterization, suggesting that quantitative pore morphology studies on a large number of pores performed on dried samples are representative of the preserved core samples. On the other hand, the drying damage observed in this contribution is proposed to be responsible of the changes of fluid flow properties typically measured by other authors on preserved and dried specimens of clays.
Keywords :
Pore damage , BIB–cryo-SEM , Boom Clay , Imaging of pore water , Drying
Journal title :
Engineering Geology
Serial Year :
2014
Journal title :
Engineering Geology
Record number :
2342708
Link To Document :
بازگشت