Author/Authors :
Takeda، نويسنده , , T. and Yoshikawa، نويسنده , , A. and Oyaidzu، نويسنده , , M. and Nakahata، نويسنده , , T. and Nishikawa، نويسنده , , Y. and Kimura، نويسنده , , H. Russell Onishi، نويسنده , , Y. and Miyauchi، نويسنده , , H. and Oya، نويسنده , , Y. and Sagara، نويسنده , , A. and Noda، نويسنده , , N. and Okuno، نويسنده , , K.، نويسنده ,
Abstract :
TDS analyses have been performed in order to examine helium irradiation effects for deuterium retention in boron coating films prepared by PACVD. It is clarified that the deuterium retention is reduced due to the irradiation prior to deuterium. There is no correlation between the retention variations of deuterium and helium, and thus the helium occupation seems hardly to contribute to the reduction. The third peaks in the TDS spectra shift on the high temperature side with the irradiation fluence. It is presumed that helium irradiation forms certain layers by knocking on boron atoms, in which deuterium retention is partly restricted, and trapped deuterium needs higher energy for the desorption.
Keywords :
Boron coating film , TDS , PACVD , Helium irradiation prior to deuterium , Deuterium retention
