Radiation testing of diagnostic window bondings for enhanced H isotope diffusion

Simplified quartz, silica, and silicon nitride window assemblies using Al diffusion bonding have been tested for radiation enhanced H isotope diffusion, irradiating with 1.8 MeV electrons at 200 Gy/s, <40 °C. The results indicate extremely low enhanced diffusion for all 3 bondings. Optical and mechanical tests were also performed.