Title of article :
Ion bombardment induced surface electrical degradation monitoring by means of luminescence in aluminas
Author/Authors :
Malo، نويسنده , , Marta and Moroٌo، نويسنده , , Alejandro and Hodgson، نويسنده , , Eric R.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2013
Pages :
5
From page :
626
To page :
630
Abstract :
Oxide ceramics for use as electrical insulators in future fusion devices, will be exposed to ionization and displacement damage (neutrons, gammas, ion bombardment). Enhanced oxygen loss due to ion bombardment increases surface electrical conductivity, and at the same time the surface emits light due to ion beam induced luminescence (IBIL). Results for 3 types of α-alumina and sapphire measuring electrical surface conductivity and IBIL as a function of dose at different temperatures between 20 and 200 °C, show a clear correlation between luminescence and surface electrical degradation. This indicates the potential to remotely monitor insulating material degradation not only in ITER and beyond, but also in the more immediate in-reactor experiments required for materials testing. Partial reduction of degradation by heating in air suggests the possibility for in situ recovery of the insulating properties.
Keywords :
Insulators , alumina , Electrical degradation , Luminescence
Journal title :
Fusion Engineering and Design
Serial Year :
2013
Journal title :
Fusion Engineering and Design
Record number :
2360834
Link To Document :
بازگشت