Author/Authors :
Nagayama، نويسنده , , Y and Fredrickson، نويسنده , , E.D and Janos، نويسنده , , A.C and McGuire، نويسنده , , K.M and Taylor، نويسنده , , G and Yamada، نويسنده , , M، نويسنده ,
Abstract :
High-resolution fast ECE image reconstruction has been used to investigate relaxation phenomena of the electron temperature profile, which is often caused after a pellet injection, on TFTR. Drift type modes are observed before the relaxation phenomena. A possible inference of this relaxation is the localized reconnection.
