Author/Authors :
Oya، نويسنده , , Y. and Hirohata، نويسنده , , Y. and Tanabe، نويسنده , , T. and Shibahara، نويسنده , , T. and Kimura، نويسنده , , H. and Oyaidzu، نويسنده , , M. and Arai، نويسنده , , T. and Masaki، نويسنده , , K. and Gotoh، نويسنده , , Y. and Okuno، نويسنده , , K. and Miya، نويسنده , , N. and Hino، نويسنده , , T. and Tanaka، نويسنده , , S.، نويسنده ,
Abstract :
Retention profiles of hydrogen and deuterium in graphite tiles placed in the inner divertor region of JT-60U were analyzed by secondary ion mass spectroscopy (SIMS) and thermal desorption spectroscopy (TDS). The difference in hydrogen and deuterium retention behaviour is discussed considering the frequency of the strike-point hit and history of NBI heating power. It was found that most of hydrogen/deuterium was retained in the deposited layers, HH deposition layers/DD deposition layers or co-deposited with carbon. Owing to the higher heating power of DD discharges, the deuterium concentration in the DD deposition layers was much lower than that of hydrogen in the HH deposition layers. On the area showing no deposition, very shallow profile of deuterium dominated hydrogen profile. These results indicate that the tritium retention is strongly influenced by the history of discharge and temperatures. Tritium retention on graphite tiles and deposition layers could be significantly reduced with increasing the operation temperature.
Keywords :
Hydrogen isotope , PSI , Graphite , SIMS , TDS , JT-60U