Title of article :
Threshold energy of formation of an oxygen vacancy defect in SiO2 by atomic displacements using molecular dynamics
Author/Authors :
Mota، نويسنده , , F. and Caturla، نويسنده , , M.-J. and Perlado، نويسنده , , J.M and Dominguez، نويسنده , , E. and Kubota، نويسنده , , A.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
4
From page :
1027
To page :
1030
Abstract :
The interest on the effects of radiation in vitreous silica has increased recently due to its possible application as optical transmission component in fusion reactors. This material will be exposed to high neutron irradiation fluxes during operation that can change its mechanical and optical properties. In this paper, we present molecular dynamics simulations of defect production in amorphous silica. In particular, we study the minimum energy required to generate a stable oxygen vacancy by atomic displacements. A range of energies that differs significantly depending on the initial displaced atom being silicon or oxygen is presented. We show that an oxygen recoil is able to easily generate stable oxygen vacancies while a silicon recoil requires much higher energies to produce stable oxygen vacancies.
Journal title :
Fusion Engineering and Design
Serial Year :
2005
Journal title :
Fusion Engineering and Design
Record number :
2369857
Link To Document :
بازگشت