Signatures of differential Log R–V characteristics for non-uniformity analysis of HgCdTe infrared photodiode arrays

In continuation to our research on the non-uniformity in infrared focal plane arrays of HgCdTe photodiodes, we have examined and found a few important signature parameters in the forward bias region of the electrical characteristics of the photodiodes. These signatures are the peaks of the first and second order derivatives of dynamic resistance–voltage characteristics. They show good correlation with the material and devices parameters and have been investigated to be good signatures for statistical performance variation analysis. In this note, by using theoretical model and statistical analysis of these signatures, we show that the variations in the proposed signatures represent underlying non-uniformity in important material/device parameters. Such signatures may be used along with the other conventional signatures of reverse biased photodiode characteristics to identify the root cause of response non-uniformity in the array with high confidence level.