مرکز منطقه ای اطلاع رساني علوم و فناوري - A quantile–quantile plot based pattern matching for defect detection

Title of article :

A quantile–quantile plot based pattern matching for defect detection

Author/Authors :

Du-Ming Tsai، نويسنده , , Cheng-Hsiang Yang، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2005

Pages :

From page :

1948

To page :

1962

Keywords :

Defect detection , Pattern matching , Similarity measure , Quantile–quantile plot

Journal title :

PATTERN RECOGNITION LETTERS

Serial Year :

2005

Journal title :

PATTERN RECOGNITION LETTERS

Record number :

251167

Link To Document :