Title of article :
Inuence of composition on the structure and optoelectronic properties of Pbx In25-x Se75 thin films
Author/Authors :
ELMELEEGI, Hesham Azmi National Research Center (NRC) - Electron Microscope and Thin Films Department, Physical Research Division, Egypt , EL MANDOUH, Zeinab El Sayed National Research Center (NRC) - Electron Microscope and Thin Films Department, Physical Research Division, Egypt , Ahmad, Abdel MOEZ National Research Center (NRC) - Solid State Physics Department, Physical Research Division, Egypt
Abstract :
Pbx In25-x Se75 thin films with 2 compositions were prepared by thermal evaporation. The surface topography of these films was studied by transmission electron microscope. The optical reectance and transmittance were studied in order to determine the optical parameters such as optical energy gap, refractive index, extinction coefficient, dielectric loss, and dielectric tangent loss for these films. A single oscillator theory equation was applied for these films in order to determine both dispersion energy and oscillating energy, and the ratio of free carrier concentration/effective mass (N/m*) was determined optically. It was found that change in the composition of these films affects strongly all their optical and dielectric results.
Keywords :
Thin films , structure , optical properties , dielectric loss , optical conductivity , optical switching
Journal title :
Turkish Journal of Physics
Journal title :
Turkish Journal of Physics
