Title of article
Computing metric and partition dimension of tessellation of plane by boron nanosheets
Author/Authors
Mohammed ، Mohanad Ali Department of Mathematics - Open Educational College - Ministry of Education , Munshid ، Ameer. J. Dhi Qar Education Directorate - Ministry of Education , Siddiqui ، Hafiz Muhammad Afzal Department of Mathematics - COMSATS University Islamabad, Lahore Campus , Farahani ، Mohammad Reza Department of Mathematics - Iran University of Science and Technology (IUST)
From page
1064
To page
1071
Abstract
Metric dimension dim(G) and portion dimension pd(G) are usually related as pd(G)≤dim(G)+1. However, if the partition dimension is significantly smaller than the metric dimension, then it is termed as discrepancy. This paper mainly deals with metric dimension and partition dimension of tessellation of plane by boron nanosheets. It has been proved that there is a discrepancy between the mentioned parameters of the boron nanosheets. Moreover, some induced subgraphs of the stated sheets have been considered for the study of their metric dimension.
Keywords
Metric dimension , partition dimension , basis , resolving set , boron nanotube.
Journal title
Eurasian Chemical Communications
Journal title
Eurasian Chemical Communications
Record number
2577801
Link To Document