Title of article
ENHANCED DIGITAL TEST AND CHARACTERIZATION OF CONTROLLED-IMPEDANCE BUFFERS
Author/Authors
Al-Yamani, Ahmad A. King Fahd University of Petroleum and Minerals - Department of Computer Engineering, Saudi Arabia
From page
131
To page
141
Abstract
This paper presents an architecture that enhances the testability of controlled- impedance buffers (CIBs). By testing CIBs digitally, the new architecture overcomes most of the problems with the traditional testing method. Most of these problems are test cost related. While reducing the test cost, the new architecture allows for higher test quality that even includes delay testing capabilities.
Keywords
computer engineering , digital testing , IO testing , IO characterization
Journal title
The Arabian Journal for Science and Engineering
Journal title
The Arabian Journal for Science and Engineering
Record number
2578143
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