Reflection of Polarized Light at Quasi-Index-Matched Dielectric-Conductor Interfaces

Quasi-index-matched (QIM) dielectric-conductor interfaces are characterized by a unit-magnitude complex relative dielectric function, ε = exp(- jθ ),0 ≤θ ≤ π , and exhibit minimum reflectance at normal incidence. Their reflection properties are analyzed in detail as functions of the incident linear polarization (p or s), angle of incidence Φ and θ. Complex-plane trajectories of the Fresnel reflection coefficients rp (Φ), rs (Φ) and their ratio ρ(Φ) = rp / rs = tan Ψ exp( jΔ) as Φ increases from 0 to 90° are presented at discrete values of θ. Absolute values and phase angles of rp, rs and ρ are also plotted as functions of Φ. Finally, the pseudo-Brewster angle of minimum |rp| , the second-Brewster angle of minimum |ρ| , the principal angle at which Δ= π / 2 and the special angle (Φ = sin^-1 ⱱ0.5secθ) at which δ p = arg(rp ) = ±π of QIM interfaces are determined as functions of θ.