Title of article :
Characterization of CdO film AFM and XRD Diffraction Using Rietveld Refinement
Author/Authors :
al-dhahir, tarq a. university of baghdad - college of education for pure science(ibn al-haitham) - department of physics, Iraq , khodair, ziad t. university of diala - college of science - department of physics, Iraq
Abstract :
Nano particles of Cadmium Oxide (CdO) thin films were prepared by spray pyrolysis
technique. The synthesized film is annealed at (200 , 300, 450) o C for 3 hours . The XRD and
AFM for the analysis of its structural and micro-structural characteristic has been preformed.
The average grain size was found to be about 32.50 nm .There is a preferred orientation along
(200) plane with texture coefficient 1.79, 1.644, 1.763 and 1.792 for deposited and
annealed films, corresponding to grain size 57,58 ,51 and 51 nm. The variations of stress with
temperature is ranged from 0.157 - 0.376 GPa .
Keywords :
Nano CdO , Grain size , Rietveld Refinement , Preferred orientation , Spray pyrolysis
Journal title :
Ibn Alhaitham Journal For Pure and Applied Science
Journal title :
Ibn Alhaitham Journal For Pure and Applied Science
