Title of article :
Percutaneous Punctured Transcatheter Device Closure of Residual Shunt after Ventricular Septal Defect Repair
Author/Authors :
Mo, Xuming Department of Cardiothoracic Surgery - the Affiliated Children’s Hospital of Nanjing Medical University, Nanjing, Jiangsu , Qi, Jirong Department of Cardiothoracic Surgery - the Affiliated Children’s Hospital of Nanjing Medical University, Nanjing, Jiangsu , Zuo, Weisong Department of Cardiothoracic Surgery - the Affiliated Children’s Hospital of Nanjing Medical University, Nanjing, Jiangsu
Pages :
4
From page :
1
To page :
4
Abstract :
Ventricular septal defects (VSDs) are estimated to account for 20 to 30% of all congenital heart defects (CHDs). Although a residual shunt is the most common complication of VSD surgery, a second operation that applies the surgical repair method is very difficult because it can increase the possibility of uncontrolled bleeding and the severity of tissue adhesion. Here, we present the first case of percutaneous punctured transcatheter device closure of a residual shunt after VSD repair as a novel method to further develop for the treatment of children with congenital heart disease.
Keywords :
Transcatheter , Percutaneous Punctured , Ventricular Septal Defect Repair
Journal title :
Case Reports in Cardiology
Serial Year :
2016
Full Text URL :
Record number :
2608410
Link To Document :
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