Magnetization Analysis by Spin-Polarized ScanningElectron Microscopy

Spin-polarized scanning electron microscopy (spin SEM) is a method for observing magnetic-domain structures by detecting thespin polarization of secondary electrons. It has several unique abilities such as detection of full magnetization orientation and high-spatial-resolution measurement. Several spin-SEM experiments have demonstrated that it is a promising method for studyingvarious types of magnetic materials and devices. This review paper presents several spin-SEM observations to demonstrate thecapability and potential of spin SEM.