Author/Authors :
GHAZALI, AINA MARDHIYAH M. International Islamic University Malaysia - Faculty of Engineering - Department of Science in Engineering, Malaysia , BUGGE, AUDUN NYSTAD Norwegian University of Science and Technology - Department of Electronics and Telecommunications, Norway , SAUGE, SEBASTIEN ,Royal Institute of Technology (KTH) - School of Information and Communication Technology, Sweden , MAKAROV, VADIM Norwegian University of Science and Technology - Department of Electronics and Telecommunications, Norway
Abstract :
We report an automated characterization of a single-photon detector based on commercial silicon avalanche photodiode (PerkinElmer C30902SH). The photodiode is characterized by I-V curves at different illumination levels (darkness, 10 pW and 10 μW), dark count rate and photon detection efficiency at different bias voltages. The automated characterization routine is implemented in C++ running on a Linux computer.
Keywords :
avalanche photodiode (APD) , single photon detector , photon counting , experiment automation
