Author/Authors :
al-qudah, a. m. mu’tah university - department of physics, Al-Karak, Jordan , alnawasreh, s. s. mu’tah university - department of physics, Al-Karak, Jordan , madanat, m. a. mu’tah university - department of physics, Al-Karak, Jordan , trzaska, o. wrocław university of technology - laboratory of plastics, Wroclaw, Poland , matykiewicz, d. poznan university of technology - institute of materials technology, Poznan, Poland , alrawshdeh, s. s. mu’tah university - department of mechanical engineering, Al-Karak, Jordan , hagmann, m. j. university of utah - department of electrical and computer engineering, Salt Lake City, usa , mousa, m. s. mu’tah university - department of physics, Al-Karak, Jordan
Abstract :
Field electron emission measurements were performed on composite tips (Insulator- Tungsten) that were prepared by electrochemical etching in NaOH solution. The current-voltage (I-V) characteristics and field electron emission images were recorded under UHV conditions with a base pressure of 10-9 mbar. Next, the tips were coated with several different types of dielectric layers. Various techniques were employed to measure the characteristics of these types of emitters and to evaluate the effects of different types of dielectric coatings on the performance and reliability of such an electron source.
Keywords :
Field electron emitter , Dielectric layers , Composite tip , Field electron microscope
