Title of article :
Synthesis Nanocrystalline Cadmium Sulphide Film and the Influence of Cu Doping on the Physical Characterization
Author/Authors :
Zaker, Thoalfiqar Ali Department of Physics - Collge of Education - University of Al-Hamdaniya - Al-Hamdaniya - Nineveh, Iraq , Alweiy, Noora Aziz Department of Medical Physics - Al–Mustaqbal University College - Babylon, Iraq , Jabbar, Ali Mohammed Department of Physics - College of Science - Mustansiriyah University - Baghdad, Iraq , Abass, Khalid Haneen Department of Physics - College of Education for Pure Sciences - University of Babylon, Iraq , Fadhil Habubi, Nadir Department of Physics - College of Education - Mustansiriyah University - Baghdad, Iraq , Salman Chiad, Sami Department of Physics - College of Education - Mustansiriyah University - Baghdad, Iraq
Pages :
7
From page :
269
To page :
275
Abstract :
A thin film is a layer of material ranging from fractions of a nanometer to several micrometers in thickness. The controlled production of materials as thin films is a crucial step in many applications. In this work, CdS thin films were prepared by spray pyrolysis procedure at temperature 450 oC. The XRD, AFM and UV-Visible analysis were utilized to investigate the CdS films. The XRD investigation showed that prepared thin films have hexagonal structure with a particular direction along (101) plane. The crystallite size was measured from X-ray diffraction utilizing Scherrer's equation. Atomic force microscopy (AFM) confirmed that the grain was consistently disseminated over the outside of the substrate for the CdS films. The grain size of the nanoparticles were calculated 66.26, 57.11 and 56.52 nm for the CdS, CdS :2% Cu, CdS :4% Cu respectively. The optical properties were done utilizing the UV-Visible analysis. It is found that Cu content affect the optical properties and via increasing the Cu amount, the band gap was decreased.
Keywords :
AFM , Band gab , CdS Thin Films , Spray pyrolysis , UV , XRD
Journal title :
Journal of NanoStructures
Serial Year :
2021
Record number :
2688779
Link To Document :
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