Author/Authors :
Al.Haidery, Jenan H. University of Nihreen - college of Science - Department of physics, Iraq , Al.Ansari, Ramaz A. university of Baghdad - college of Science for women - Department of physics, Iraq , Al.Lamy, Hussien K. university of Baghdad - college of Science - Department of physics, Iraq , Mohammed, Hanaa I. University of Baghdad - College of Education Ibn Al- Haitham - Department of Physics, Iraq
Abstract :
In this research the a-As flims have been prepared by thermal evaporation with thickness 250 nm and rata of deposition (1.04nm/sec) as function to annealing temperature (373 and 373K), from XRD analysis we can see that the degree of crystalline increase with , and I-V characteristic for dark and illumination shows that forward bias current varieties approximately exponentially with voltage bias. Also we found that the quality factor and saturation current dependence on annealing temperatures
