• Title of article

    Evaluating Feature Extractors and Dimension Reduction Methods for Near Infrared Face Recognition Systems

  • Author/Authors

    Farokhi, Sajad Universiti Teknologi Malaysia - Faculty of Electrical Engineering, Malaysia , Sheikh, Usman Ullah Universiti Teknologi Malaysia - Faculty of Electrical Engineering, Malaysia , Flusser, Jan Academy of Sciences of the Czech Republic - Institute of Information Theory and Automation, Czech Republic , Shamsuddin, Siti Mariyam UTM Big Data Centre - Faculty of Computing - Universiti Teknologi Malaysia, Malaysia , Hashemi, Hossein Salehan Institute of Higher Education, ايران

  • From page
    23
  • To page
    33
  • Abstract
    This study evaluates the performance of global and local feature extractors as well as dimension reduction methods in NIR domain. Zernike moments (ZMs), Independent Component Analysis (ICA), Radon Transform + Discrete Cosine Transform (RDCT), Radon Transform + Discrete Wavelet Transform (RDWT) are employed as global feature extractors and Local Binary Pattern (LBP), Gabor Wavelets (GW), Discrete Wavelet Transform (DWT) and Undecimated Discrete Wavelet Transform (UDWT) are used as local feature extractors. For evaluation of dimension reduction methods Principal Component Analysis (PCA), Kernel Principal Component Analysis (KPDA), Linear Discriminant Analysis + Principal Component Analysis (Fisherface), Kernel Fisher Discriminant Analysis (KFD) and Spectral Regression Discriminant Analysis (SRDA) are used. Experiments conducted on CASIA NIR database and PolyU-NIRFD database indicate that ZMs as a global feature extractor, UDWT as a local feature extractor and SRDA as a dimension reduction method have superior overall performance compared to some other methods in the presence of facial expressions, eyeglasses, head rotation, image noise and misalignments.
  • Keywords
    Face recognition , near infrared , comparative study , Zernike moments , undecimated discrete wavelet transform
  • Journal title
    Jurnal Teknologi :F
  • Journal title
    Jurnal Teknologi :F
  • Record number

    2716720